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 NX3L1T3157
Low-ohmic single-pole double-throw analog switch
Rev. 07 -- 21 January 2010 Product data sheet
1. General description
The NX3L1T3157 is a low-ohmic single-pole double-throw analog switch suitable for use as an analog or digital 2:1 multiplexer/demultiplexer. It has a digital select input (S), two independent inputs/outputs (Y0 and Y1) and a common input/output (Z). Schmitt trigger action at the digital input makes the circuit tolerant to slower input rise and fall times. Low threshold digital input allows this device to be driven by 1.8 V logic levels in 3.3 V applications without significant increase in supply current ICC. The NX3L1T3157 allows signals with amplitude up to VCC to be transmitted from Z to Y0 or Y1, or from Y0 or Y1 to Z. Its low ON resistance (0.5 ) and flatness (0.13 ) ensures minimal attenuation and distortion of transmitted signals.
2. Features
Wide supply voltage range from 1.4 V to 4.3 V Very low ON resistance (peak): 1.6 (typical) at VCC = 1.4 V 1.0 (typical) at VCC = 1.65 V 0.55 (typical) at VCC = 2.3 V 0.50 (typical) at VCC = 2.7 V 0.50 (typical) at VCC = 4.3 V Break-before-make switching High noise immunity ESD protection: HBM JESD22-A114E Class 3A exceeds 7500 V MM JESD22-A115-A exceeds 200 V CDM AEC-Q100-011 revision B exceeds 1000 V IEC61000-4-2 contact discharge exceeds 8000 V for switch ports CMOS low-power consumption Latch-up performance exceeds 100 mA per JESD 78 Class II Level A 1.8 V control logic at VCC = 3.6 V Control input accepts voltages above supply voltage Very low supply current, even when input is below VCC High current handling capability (350 mA continuous current under 3.3 V supply) Specified from -40 C to +85 C and from -40 C to +125 C
NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
3. Applications
Cell phone PDA Portable media player
4. Ordering information
Table 1. Ordering information Package Temperature range NX3L1T3157GW NX3L1T3157GM -40 C to +125 C -40 C to +125 C Name SC-88 XSON6 Description plastic surface-mounted package; 6 leads plastic extremely thin small outline package; no leads; 6 terminals; body 1 x 1.45 x 0.5 mm Version SOT363 SOT886 Type number
5. Marking
Table 2. Marking codes[1] Marking code MI MI Type number NX3L1T3157GW NX3L1T3157GM
[1]
The pin 1 indicator is located on the lower left corner of the device, below the marking code.
6. Functional diagram
Y1
S S6 1 Y1 Z4 3 Y0
001aac354
Z
Y0
001aac355
Fig 1.
Logic symbol
Fig 2.
Logic diagram
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Product data sheet
Rev. 07 -- 21 January 2010
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
7. Pinning information
7.1 Pinning
NX3L1T3157 NX3L1T3157
Y1 GND 1 2 6 5 S GND VCC Y0 Y0 3
001aai329
Y1
1
6
S
2
5
VCC
3
4
Z
4
Z
001aah441
Transparent top view
Fig 3. Pin configuration SOT363 (SC-88)
Fig 4.
Pin configuration SOT886 (XSON6)
7.2 Pin description
Table 3. Symbol Y1 GND Y0 Z VCC S Pin description Pin 1 2 3 4 5 6 Description independent input or output ground (0 V) independent input or output common output or input supply voltage select input
8. Functional description
Table 4. Input S L H
[1] H = HIGH voltage level; L = LOW voltage level.
Function table[1] Channel on Y0 Y1
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Product data sheet
Rev. 07 -- 21 January 2010
3 of 21
NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
9. Limiting values
Table 5. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V). Symbol VCC VI VSW IIK ISK ISW Parameter supply voltage input voltage switch voltage input clamping current switch clamping current switch current VI < -0.5 V VI < -0.5 V or VI > VCC + 0.5 V VSW > -0.5 V or VSW < VCC + 0.5 V; source or sink current VSW > -0.5 V or VSW < VCC + 0.5 V; pulsed at 1 ms duration, < 10 % duty cycle; peak current Tstg Ptot
[1] [2] [3]
Conditions select input S
[1] [2]
Min -0.5 -0.5 -0.5 -50 -
Max +4.6 +4.6 50 350 500
Unit V V mA mA mA mA
VCC + 0.5 V
storage temperature total power dissipation Tamb = -40 C to +125 C
[3]
-65 -
+150 250
C mW
The minimum input voltage rating may be exceeded if the input current rating is observed. The minimum and maximum switch voltage ratings may be exceeded if the switch clamping current rating is observed but may not exceed 4.6 V. For SC-88 package: above 87.5 C the value of Ptot derates linearly with 4.0 mW/K. For XSON6 package: above 118 C the value of Ptot derates linearly with 7.8 mW/K.
10. Recommended operating conditions
Table 6. VCC VI VSW Tamb t/V
[1]
Recommended operating conditions Conditions select input S
[1]
Symbol Parameter supply voltage input voltage switch voltage ambient temperature input transition rise and fall rate
Min 1.4 0 0 -40 -
Max 4.3 4.3 VCC +125 200
Unit V V V C ns/V
VCC = 1.4 V to 4.3 V
[2]
To avoid sinking GND current from terminal Z when switch current flows in terminal Yn, the voltage drop across the bidirectional switch must not exceed 0.4 V. If the switch current flows into terminal Z, no GND current will flow from terminal Yn. In this case, there is no limit for the voltage drop across the switch. Applies to control signal levels.
[2]
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(c) NXP B.V. 2010. All rights reserved.
Product data sheet
Rev. 07 -- 21 January 2010
4 of 21
NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
11. Static characteristics
Table 7. Static characteristics At recommended operating conditions; voltages are referenced to GND (ground 0 V). Symbol Parameter Conditions Min VIH HIGH-level input voltage VCC = 1.4 V to 1.6 V VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 3.6 V to 4.3 V VIL LOW-level input voltage VCC = 1.4 V to 1.6 V VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 3.6 V to 4.3 V II input leakage current OFF-state leakage current select input S; VI = GND to 4.3 V; VCC = 1.4 V to 4.3 V Y0 and Y1 port; see Figure 5 VCC = 1.4 V to 3.6 V VCC = 3.6 V to 4.3 V IS(ON) ON-state leakage current Z port; see Figure 6 VCC = 1.4 V to 3.6 V VCC = 3.6 V to 4.3 V 5 10 50 50 500 500 nA nA 5 10 50 50 500 500 nA nA 0.9 0.9 1.1 1.3 1.4 Tamb = 25 C Typ Max 0.3 0.4 0.4 0.5 0.6 Tamb = -40 C to +125 C Min 0.9 0.9 1.1 1.3 1.4 Max Max (85 C) (125 C) 0.3 0.4 0.4 0.5 0.6 0.5 0.3 0.3 0.4 0.5 0.6 1 V V V V V V V V V V A Unit
IS(OFF)
ICC
supply current VI = VCC or GND; VSW = GND or VCC VCC = 3.6 V VCC = 4.3 V 2.0 0.35 7.0 2.5 50 1.0 35 130 100 150 4.0 0.7 10.0 4.0 200 690 800 7 1 15 5 300 6000 7000 7 1 15 5 500 nA nA A A A A nA pF pF pF
ICC
additional VSW = GND or VCC supply current VI = 2.6 V; VCC = 4.3 V VI = 2.6 V; VCC = 3.6 V VI = 1.8 V; VCC = 4.3 V VI = 1.8 V; VCC = 3.6 V VI = 1.8 V; VCC = 2.5 V
CI CS(OFF) CS(ON)
input capacitance OFF-state capacitance ON-state capacitance
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Product data sheet
Rev. 07 -- 21 January 2010
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
11.1 Test circuits
switch 1 VIL or VIH S Z Y0 Y1 1 2 2 switch IS S VIH VIL
VCC
VI
VO
GND
001aac358
VI = 0.3 V or VCC - 0.3 V; VO = VCC - 0.3 V or 0.3 V.
Fig 5.
Test circuit for measuring OFF-state leakage current
VCC S Z Y0 Y1 1 2
switch 1
S VIH VIL
VIL or VIH IS
VI
2 switch
VO
GND
001aac359
VI = 0.3 V or VCC - 0.3 V; VO = VCC - 0.3 V or 0.3 V.
Fig 6.
Test circuit for measuring ON-state leakage current
NX3L1T3157_7
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Product data sheet
Rev. 07 -- 21 January 2010
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
11.2 ON resistance
Table 8. ON resistance At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for graphs see Figure 8 to Figure 14. Symbol RON(peak) Parameter ON resistance (peak) Conditions VI = GND to VCC; ISW = 100 mA; see Figure 7 VCC = 1.4 V VCC = 1.65 V VCC = 2.3 V VCC = 2.7 V VCC = 4.3 V RON ON resistance mismatch between channels VI = GND to VCC; ISW = 100 mA VCC = 1.4 V VCC = 1.65 V VCC = 2.3 V VCC = 2.7 V VCC = 4.3 V RON(flat) ON resistance (flatness) VI = GND to VCC; ISW = 100 mA VCC = 1.4 V VCC = 1.65 V VCC = 2.3 V VCC = 2.7 V VCC = 4.3 V
[1] [2] [3] Typical values are measured at Tamb = 25 C. Measured at identical VCC, temperature and input voltage. Flatness is defined as the difference between the maximum and minimum value of ON resistance measured at identical VCC and temperature.
[3] [2]
Tamb = -40 C to +85 C Tamb = -40 C to +125 C Unit Min Typ[1] Max Min Max
-
1.6 1.0 0.55 0.5 0.5
3.7 1.6 0.8 0.75 0.75
-
4.1 1.7 0.9 0.9 0.9

-
0.04 0.04 0.02 0.02 0.02
0.3 0.2 0.08 0.075 0.075
-
0.3 0.3 0.1 0.1 0.1

-
1.0 0.5 0.15 0.13 0.2
3.3 1.2 0.3 0.3 0.4
-
3.6 1.3 0.35 0.35 0.45

NX3L1T3157_7
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Product data sheet
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
11.3 ON resistance test circuit and graphs
1.6 RON () 1.2
001aag564
VSW V VCC S Z
VI
(1)
0.8 switch 1 S VIL VIH 0.4
(2) (3) (4) (5) (6)
VIL or VIH
Y0 1 switch Y1 2
2
ISW
GND
001aag563
0 0 1 2 3 4 VI (V) 5
RON = VSW / ISW.
(1) VCC = 1.5 V. (2) VCC = 1.8 V. (3) VCC = 2.5 V. (4) VCC = 2.7 V. (5) VCC = 3.3 V. (6) VCC = 4.3 V. Measured at Tamb = 25 C.
Fig 7.
Test circuit for measuring ON resistance
Fig 8.
Typical ON resistance as a function of input voltage
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Product data sheet
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
1.6 RON () 1.2
001aag565
1.0 RON () 0.8
(1) (2) (3) (4)
001aag566
0.6 0.8
(1) (2) (3) (4)
0.4
0.4 0.2
0 0 1 2 VI (V) 3
0 0 1 2 VI (V) 3
(1) Tamb = 125 C. (2) Tamb = 85 C. (3) Tamb = 25 C. (4) Tamb = -40 C.
(1) Tamb = 125 C. (2) Tamb = 85 C. (3) Tamb = 25 C. (4) Tamb = -40 C.
Fig 9.
ON resistance as a function of input voltage; VCC = 1.5 V
Fig 10. ON resistance as a function of input voltage; VCC = 1.8 V
1.0 RON () 0.8
001aag567
1.0 RON () 0.8
001aag568
0.6
(1) (2) (3) (4)
0.6
(1) (2) (3) (4)
0.4
0.4
0.2
0.2
0 0 1 2 VI (V) 3
0 0 1 2 VI (V) 3
(1) Tamb = 125 C. (2) Tamb = 85 C. (3) Tamb = 25 C. (4) Tamb = -40 C.
(1) Tamb = 125 C. (2) Tamb = 85 C. (3) Tamb = 25 C. (4) Tamb = -40 C.
Fig 11. ON resistance as a function of input voltage; VCC = 2.5 V
Fig 12. ON resistance as a function of input voltage; VCC = 2.7 V
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Product data sheet
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
1.0 RON () 0.8
001aag569
1.0 RON () 0.8
001aaj896
0.6
(1) (2) (3) (4)
0.6
(1) (2) (3) (4)
0.4
0.4
0.2
0.2
0 0 1 2 3 VI (V) 4
0 0 1 2 3 4 VI (V) 5
(1) Tamb = 125 C. (2) Tamb = 85 C. (3) Tamb = 25 C. (4) Tamb = -40 C.
(1) Tamb = 125 C. (2) Tamb = 85 C. (3) Tamb = 25 C. (4) Tamb = -40 C.
Fig 13. ON resistance as a function of input voltage; VCC = 3.3 V
Fig 14. ON resistance as a function of input voltage; VCC = 4.3 V
12. Dynamic characteristics
Table 9. Dynamic characteristics At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for load circuit see Figure 17. Symbol Parameter Conditions Min ten enable time S to Z or Yn; see Figure 15 VCC = 1.4 V to 1.6 V VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 3.6 V to 4.3 V tdis disable time S to Z or Yn; see Figure 15 VCC = 1.4 V to 1.6 V VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 3.6 V to 4.3 V 32 20 12 10 10 70 55 25 20 20 80 60 30 25 25 90 65 35 30 30 ns ns ns ns ns 50 36 24 22 22 90 70 45 40 40 120 80 50 45 45 120 90 55 50 50 ns ns ns ns ns 25 C Typ[1] Max -40 C to +125 C Min Max (85 C) Max (125 C) Unit
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Product data sheet
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NX3L1T3157
Low-ohmic single-pole double-throw analog switch
Table 9. Dynamic characteristics ...continued At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for load circuit see Figure 17. Symbol Parameter Conditions Min tb-m break-before-make see Figure 16 time VCC = 1.4 V to 1.6 V VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V VCC = 3.6 V to 4.3 V
[1] [2]
[2]
25 C Typ[1] Max
-40 C to +125 C Min Max (85 C) Max (125 C) -
Unit
-
19 17 13 10 10
-
9 7 4 3 2
ns ns ns ns ns
Typical values are measured at Tamb = 25 C and VCC = 1.5 V, 1.8 V, 2.5 V, 3.3 and 4.3 V respectively. Break-before-make guaranteed by design.
12.1 Waveform and test circuits
VI S input GND ten VOH Y1 connected to VEXT Z output OFF to HIGH HIGH to OFF GND tdis Z output HIGH to OFF OFF to HIGH VOH VX ten VX
001aag570
VM
tdis VX VX
Y0 connected to VEXT
GND
Measurement points are given in Table 10. Logic level: VOH is typical output voltage level that occurs with the output load.
Fig 15. Enable and disable times Table 10. VCC 1.4 V to 4.3 V Measurement points Input VM 0.5VCC Output VX 0.9VOH
Supply voltage
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Product data sheet
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
VCC S Z Y0 Y1 VEXT = 1.5 V
G
VI
V
VO
RL
CL
GND
001aag571
a. Test circuit
VI
0.5VI
0.9VO VO tb-m
0.9VO
001aag572
b. Input and output measurement points Fig 16. Test circuit for measuring break-before-make timing
VCC S Z Y0 Y1 1 2
switch
G
VI
V
VO
RL
CL
VEXT = 1.5 V
GND
001aag642
Test data is given in Table 11. Definitions test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. VEXT = External voltage for measuring switching times.
Fig 17. Load circuit for switching times Table 11. VCC 1.4 V to 4.3 V Test data Input VI VCC tr, tf 2.5 ns Load CL 35 pF RL 50
Supply voltage
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Product data sheet
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NX3L1T3157
Low-ohmic single-pole double-throw analog switch
12.2 Additional dynamic characteristics
Table 12. Additional dynamic characteristics At recommended operating conditions; voltages are referenced to GND (ground = 0 V); VI = GND or VCC (unless otherwise specified); tr = tf 2.5 ns; Tamb = 25 C. Symbol Parameter THD total harmonic distortion Conditions fi = 20 Hz to 20 kHz; RL = 32 ; see Figure 18 VCC = 1.4 V; VI = 1 V (p-p) VCC = 1.65 V; VI = 1.2 V (p-p) VCC = 2.3 V; VI = 1.5 V (p-p) VCC = 2.7 V; VI = 2 V (p-p) VCC = 4.3 V; VI = 2 V (p-p) f(-3dB) iso Vct -3 dB frequency response isolation (OFF-state) crosstalk voltage RL = 50 ; see Figure 19 VCC = 1.4 V to 4.3 V fi = 100 kHz; RL = 50 ; see Figure 20 VCC = 1.4 V to 4.3 V between digital inputs and switch; fi = 1 MHz; CL = 50 pF; RL = 50 ; see Figure 21 VCC = 1.4 V to 3.6 V VCC = 3.6 V to 4.3 V Qinj charge injection fi = 1 MHz; CL = 0.1 nF; RL = 1 M; Vgen = 0 V; Rgen = 0 ; see Figure 22 VCC = 1.5 V VCC = 1.8 V VCC = 2.5 V VCC = 3.3 V VCC = 4.3 V
[1] fi is biased at 0.5VCC.
[1] [1] [1]
Min -
Typ 0.15 0.10 0.02 0.02 0.02 60 -90
Max -
Unit % % % % % MHz dB
-
0.2 0.3
-
V V
-
3 4 6 9 15
-
pC pC pC pC pC
12.3 Test circuits
VCC 0.5VCC
RL
switch 1
S VIL VIH
VIL or VIH
S Z
Y0 1 switch Y1 2
2
fi
D GND
001aag573
Fig 18. Test circuit for measuring total harmonic distortion
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Product data sheet
Rev. 07 -- 21 January 2010
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
VCC
0.5VCC
RL
switch 1
S VIL VIH
VIL or VIH
S Z
Y0 1 switch Y1 2
2
fi
dB GND
001aag574
Adjust fi voltage to obtain 0 dBm level at output. Increase fi frequency until dB meter reads -3 dB.
Fig 19. Test circuit for measuring the frequency response when channel is in ON-state
0.5VCC
RL
VCC
0.5VCC
RL
switch 1
S VIH VIL
VIL or VIH
S Z
Y0 1 switch Y1 2
2
fi
dB GND
001aag561
Adjust fi voltage to obtain 0 dBm level at input.
Fig 20. Test circuit for measuring isolation (OFF-state)
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Product data sheet
Rev. 07 -- 21 January 2010
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NX3L1T3157
Low-ohmic single-pole double-throw analog switch
switch VCC 1 2 S Z G logic input Y0 Y1 1 2 switch
S VIL VIH
VI
RL
RL
CL
V
VO
0.5VCC
0.5VCC
001aah442
a. Test circuit
logic input (S)
off
on
off
VO
Vct
001aah443
b. Input and output pulse definitions Fig 21. Test circuit for measuring crosstalk voltage between digital inputs and switch
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Product data sheet
Rev. 07 -- 21 January 2010
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NX3L1T3157
Low-ohmic single-pole double-throw analog switch
VCC S Z Y0 Y1 1 2
Rgen VI
switch
G
VO
RL
CL
Vgen
GND
001aac366
a. Test circuit
logic (S) off input
on
off
VO
VO
001aac478
b. Input and output pulse definitions
Definition: Qinj = VO x CL. VO = output voltage variation. Rgen = generator resistance. Vgen = generator voltage.
Fig 22. Test circuit for measuring charge injection
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Product data sheet
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NX3L1T3157
Low-ohmic single-pole double-throw analog switch
13. Package outline
Plastic surface-mounted package; 6 leads SOT363
D
B
E
A
X
y
HE
vMA
6
5
4
Q
pin 1 index
A
A1
1
e1 e
2
bp
3
wM B detail X Lp
c
0
1 scale
2 mm
DIMENSIONS (mm are the original dimensions) UNIT mm A 1.1 0.8 A1 max 0.1 bp 0.30 0.20 c 0.25 0.10 D 2.2 1.8 E 1.35 1.15 e 1.3 e1 0.65 HE 2.2 2.0 Lp 0.45 0.15 Q 0.25 0.15 v 0.2 w 0.2 y 0.1
OUTLINE VERSION SOT363
REFERENCES IEC JEDEC JEITA SC-88
EUROPEAN PROJECTION
ISSUE DATE 04-11-08 06-03-16
Fig 23. Package outline SOT363 (SC-88)
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Product data sheet
Rev. 07 -- 21 January 2010
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NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
XSON6: plastic extremely thin small outline package; no leads; 6 terminals; body 1 x 1.45 x 0.5 mm
SOT886
b 1 2 3 4x L1 L
(2)
e
6 e1
5 e1
4
6x
(2)
A
A1 D
E
terminal 1 index area 0 DIMENSIONS (mm are the original dimensions) UNIT mm A (1) max 0.5 A1 max 0.04 b 0.25 0.17 D 1.5 1.4 E 1.05 0.95 e 0.6 e1 0.5 L 0.35 0.27 L1 0.40 0.32 1 scale 2 mm
Notes 1. Including plating thickness. 2. Can be visible in some manufacturing processes. OUTLINE VERSION SOT886 REFERENCES IEC JEDEC MO-252 JEITA EUROPEAN PROJECTION ISSUE DATE 04-07-15 04-07-22
Fig 24. Package outline SOT886 (XSON6)
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Product data sheet
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NX3L1T3157
Low-ohmic single-pole double-throw analog switch
14. Abbreviations
Table 13. Acronym CDM CMOS ESD HBM MM PDA Abbreviations Description Charged Device Model Complementary Metal-Oxide Semiconductor ElectroStatic Discharge Human Body Model Machine Model Personal Digital Assistant
15. Revision history
Table 14. Revision history Release date 20100121 Data sheet status Product data sheet Change notice Supersedes NX3L1T3157_6 Document ID NX3L1T3157_7 Modifications: NX3L1T3157_6 NX3L1T3157_5 NX3L1T3157_4 NX3L1T3157_3 NX3L1T3157_2 NX3L1T3157_1
* *
Section 2: IEC61000-4-2 added. Table 8: ON resistance (flatness) changed at VCC = 4.3 V. Product data sheet Product data sheet Product data sheet Product data sheet Product data sheet Product data sheet NX3L1T3157_5 NX3L1T3157_4 NX3L1T3157_3 NX3L1T3157_2 NX3L1T3157_1 -
20090415 20080728 20080718 20080408 20080306 20080103
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Product data sheet
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Low-ohmic single-pole double-throw analog switch
16. Legal information
16.1 Data sheet status
Document status[1][2] Objective [short] data sheet Preliminary [short] data sheet Product [short] data sheet
[1] [2] [3]
Product status[3] Development Qualification Production
Definition This document contains data from the objective specification for product development. This document contains data from the preliminary specification. This document contains the product specification.
Please consult the most recently issued document before initiating or completing a design. The term `short data sheet' is explained in section "Definitions". The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
16.2 Definitions
Draft -- The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet -- A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail.
damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer's own risk. Applications -- Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values -- Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale -- NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license -- Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Export control -- This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities.
16.3 Disclaimers
General -- Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes -- NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use -- NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental
16.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners.
17. Contact information
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com
NX3L1T3157_7
(c) NXP B.V. 2010. All rights reserved.
Product data sheet
Rev. 07 -- 21 January 2010
20 of 21
NXP Semiconductors
NX3L1T3157
Low-ohmic single-pole double-throw analog switch
18. Contents
1 2 3 4 5 6 7 7.1 7.2 8 9 10 11 11.1 11.2 11.3 12 12.1 12.2 12.3 13 14 15 16 16.1 16.2 16.3 16.4 17 18 General description . . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 3 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4 Recommended operating conditions. . . . . . . . 4 Static characteristics. . . . . . . . . . . . . . . . . . . . . 5 Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 ON resistance . . . . . . . . . . . . . . . . . . . . . . . . . . 7 ON resistance test circuit and graphs. . . . . . . . 8 Dynamic characteristics . . . . . . . . . . . . . . . . . 10 Waveform and test circuits . . . . . . . . . . . . . . . 11 Additional dynamic characteristics . . . . . . . . . 13 Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 17 Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 19 Legal information. . . . . . . . . . . . . . . . . . . . . . . 20 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 20 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Contact information. . . . . . . . . . . . . . . . . . . . . 20 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Please be aware that important notices concerning this document and the product(s) described herein, have been included in section `Legal information'.
(c) NXP B.V. 2010.
All rights reserved.
For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: salesaddresses@nxp.com Date of release: 21 January 2010 Document identifier: NX3L1T3157_7


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